In-situ microscopy & analysis

State of the art characterisation equipment allows simultaneous investigation of the structure-property-composition relationship in materials systems

The Laboratory for In-situ Microscopy & Analysis (LIMA), at Oxford’s Department of Engineering Science, offers a unique approach to simultaneously study the structure-property composition relationship in materials systems at different length scales.  Their expertise lies in the areas of advanced microscopy characterisation, in-situ micro- and nano-mechanical testing and surface analysis.

In-situ microscopy & analysis facilities include:

  • Scanning electron microscopy (SEM)
  • Electron back scatter diffraction (EBSD)
  • Elemental X-ray analysis
  • Ion beam milling
  • Atomic force microscopy (AFM)
  • Optical microscopy
  • In-situ mechanical testing
  • Surface profilometry
  • Temperature control
  • Sample preparation
  • Fixture manufacture

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